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| 價格區(qū)間 | 面議 | 觸發(fā)模式 | 脈沖式 |
|---|---|---|---|
| 產(chǎn)地類別 | 進口 | 應用領域 | 生物產(chǎn)業(yè),石油,航天,汽車,綜合 |
聚光太陽模擬器
特征
1、AAA太陽能模擬器
2、強度等級高達4000太陽
3、<2％不均勻
4、緊湊的設計
5、燈泡壽命> 10,000次閃爍
應用
1、太陽模擬
2、聚光光伏
3、高功率光伏電池（三結(jié)電池）的表征
4、加速暴露測試
A typical Non-uniformity measurement. Graph is
interpolated from 64 measurements over a
5c mx5cm area. The data indicates a
non-uniformity of 1.87%
聚光太陽光模擬器是一種緊湊而堅固的光源，可產(chǎn)生非常高的太陽輻照度，并且產(chǎn)生的不均勻性很小。Sciencetech專有的均質(zhì)化技術(shù)使FSSC能夠達到行業(yè)*佳的均勻度和功率水平。
FSSC可用于表征大尺寸為5cm x 5cm的太陽能電池和其他設備?？梢酝ㄟ^功率控制在225到4000個太陽之間的50個步長中設置誤差。
使用Sciencetech FSSC太陽能濾光片，該裝置符合AM1.5D ASTM光譜標準。
| Wavelength Band (nm) | FSSC Measure- ment (%, with AM1.5D Filter) | Air Mass 1.5D ideal spectral match (%) |
| 400-500 | 15.1 | 14.2 |
| 500-600 | 18.0 | 16.4 |
| 600-700 | 16.1 | 15.4 |
| 700-800 | 11.7 | 12.7 |
| 800-900 | 10.9 | 10.7 |
| 900-1100 | 11.5 | 13.9 |
規(guī)格
| Model | FSSC |
| Illumination Intensity | From 225 to 4000 suns (lower concentration levels possible with ND filtering) |
| Illumination Intensity Reference | Built into homogenizer, 5.377uA/Sun 11.0mA typical @2000 Suns |
| Target Area | 5cm x 5cm |
| Angle of Exit | 50 % within 30 degrees, 47.5 degrees maximum angle |
| Non-Uniformity of Irradiance | <2% typical |
| Working Distance | From 1 to 7 mm (3mm typical) |
| Spectral Match | Class A AM1.5D typical |
| Spectral Adjustability | From AM1.0 to AM2.0 with different filters |
| Flash Duration | 1mSec around peak (90% points), 2.2mSec at 50% points t |
| Minimum # of flashes per lamp | 20,000 flashes typical @2000 suns , 100,000 flashes @ 400 suns * |
| Flash to Flash Repeatability | +/- 5%, +/- 3% typical ** |
| Flash Interval | 5 seconds typical , 2 seconds minimum |
| Energy Setting | 75-2400 Joules (50 steps) |
| Dimensions (cm) | 36 x 36 x 78 |
| Dimensions including mounting frame (cm) | 61 x 61 x 82 |
T Flash duration can be widened and profile flattened with appropriate power supply, peak power level will be reduced.
* Higher power settings can degrade lamp life more quickly
** flash to flash repeatability can be reduced below 2% with power supply modification